Course: A Comprehensive Course on Surface Analysis: AES, SIMS, and XPS/ESCA

Course Objectives

• Learn about the commonly used surface analysis techniques AES, SIMS, and XPS/ESCA.

• Know the advantages and limitations of each surface analysis technique.

• Know the various ways to do depth profiling.

• Learn about the latest developments in instrumentation.

• Learn the qualitative and quantitative analysis techniques, data interpretation, and potential artifacts with each technique.

Course Description
This course is a combination of the two 1-day classes on AES, and SIMS, and the 2-day class on XPS/ESCA which are also being offered separately during this program. The combination is being offered at a significantly discounted rate compared to taking all of these courses separately ($1,495 compared to $2,000). The course will provide attendees with a comprehensive treatment of the most commonly used surface analysis methods in industry and research.

The course emphasis will be on providing a detailed understanding of the physical principles of each technique with insights into instrumentation, qualitative and quantitative analysis, and data interpretation. Examples of applications will be used to demonstrate the strengths of each technique. Additionally, important information about artifacts and the limitations of each method will be discussed.

Who Should Attend?
Scientists, engineers, and others who wish to obtain a comprehensive understanding of the most commonly used surface analysis techniques.

Instructor:  
Fred Stevie, North Carolina State University, Senior Researcher.

Course Materials:
Course Notes

Cost: $1,495.00