Science Educators Workshop

**Each listed Instructor and Course is an active link that opens to their respective descriptions.

Instructor Biography Course Description
Arvind Agarwal Introduction to Nanomanufacturing and Nanotechnology
Richard Ahrenkiel Fundamentals of Semiconductor Characterization: Electrical and Optical Techniques
Gary S. Ash Cryopump Technology
Bharat Bhushan Adhesion and Stiction: Mechanisms, Measurement Techniques, and Methods for Reduction
Nanotribology and Nanomechanics and Applications to MEMS/NEMS and BioMEMS/BioNEMS
Peter Biltoft Recent Advances in Vacuum Technology
Joel Bowers Vacuum Vessel Engineering
C.R. Brundle Full Wafer Particle and Defect Detection, Review, and Characterization
Materials and Surface Microcharacterization and Analysis
Surface Analysis, Interface, and Thin Film Analysis: The Major Methods
Thin and Ultra-thin Film Analysis, Characterization & Metrology for the Wafer Processing Industry
X-Ray Photoelectron Spectroscopy (XPS): The Basics and Advanced Approaches and Applications
David Castner Surface Characterization of Biomaterials
John Caughman Basics of Radio Frequency Technology
Bob Childs An Overview of Applied Vacuum Technology
Fundamentals of Vacuum Technology
Douglas Chrisey Pulsed Laser Deposition for Thin Film Growth
Tom Christensen Thin Film Characterization
John Coburn Plasma Etching and RIE: The Fundamentals and Applications
Timothy Coutts Transparent Conducting Oxides: Their Science, Fabrication, Properties, and Applications
John Crowell CVD for Microelectronics
Michael Current Ion Implantation: Fundamentals, Process Controls and Advanced Applications
Tom Dory Semiconductor Device Manufacturing Overview
John Frankenthaler Photolithography Process in IC Production
Steve George Atomic Layer Deposition
Tim Gessert Controlling Contamination in Vacuum Pump Systems
Fundamentals of Vacuum Technology
Operation and Maintenance of Vacuum Pumping Systems
Vacuum Leak Detection
Vacuum System Design
Abe Ghanbari Introduction to Ion Sources: Principles and Techniques
Plasma and Ion Beam Diagnostics: Principles & Applications
John Givens Chemical Mechanical Planarization for Microelectronics Manufacturing
Copper Interconnect Technology
Stanley Goldfarb Partial Pressure Analysis
Joe Greene Growth of Self-assembled Nanostructures
Reactive Sputtering and Deposition
Sputter Deposition
Thin Film Nucleation, Growth, and Microstructural Evolution
Robert Grubbs Atomic Layer Deposition: Basic Principles, Characterizations, and Applications
Luke Hinkle Mass Flow Controllers: Fundamentals, Techniques, and Applications
Process Specific Pumping Requirements and Design
Frank Jansen Plasma-Enhanced CVD: Fundamentals, Techniques, and Applications
Bob Langley Partial Pressure (RGA) Analysis
Allan Matthews Hard Coatings by PVD Methods
Richard Matyi High Resolution X-ray Reflection and Diffraction Methods for Thin Film Characterization
Gary McGuire Surface Preparation for Thin Film Deposition
John Orloff Focused Ion Beams: Principles and Applications
Ronald Outlaw Fundamentals of Vacuum Technology
UHV Design and Practices
Stella Pang Microfabrication Technology for MicroElectroMechanical Systems
Neil Peacock Total Pressure Gauging Techniques
Vacuum Sealing and Joining Techniques
Karen Reinhardt Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing
Mikko Ritala Atomic Layer Deposition: Fundamentals, Chemistry and Applications
Angus Rockett Sputter Deposition
Photovoltaics: The Engineering, Technology, and Application of Solar Cells
Bridget Rogers Semiconductor Device Manufacturing Overview
Phillip Russell Atomic Force and Scanning Tunneling Microscopy
Scanning Electron Microscopy and X-ray Microanalysis
Sudipta Seal Introduction to Nanomanufacturing and Nanotechnology
Gary Selwyn Optical Diagnostic Techniques for Plasma Processing
Randy Shul Plasma Etching and RIE: The Fundamentals and Applications
T.C. Smith Ion Implantation Processing
William Sproul Hard Coatings by PVD Methods
Sputter Deposition
Larry Stelmack Introduction to Ion Beam Coating Deposition Techniques
Fred Stevie A Comprehensive Course on Surface Analysis by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectroscopy (SIMS)
Focused Ion Beams: Principles and Applications
Secondary Ion Mass Spectrometry
Robert Waits Application of Residual Gas Analysis in Thin Film Processes
Physical and Chemical Vapor Deposition
Thin Film Deposition by Evaporation
Woody Weed An Overview to Applied Vacuum Technology
Fundamentals of Vacuum Technology
Recent Advances in Vacuum Technology
Vacuum Pumps
Randy Shul Plasma Etching and RIE: The Fundamentals and Applications
Bill Westwood Reactive Sputtering and Deposition
Sputter Deposition

Questions? Contact Heather Korff, , 530-896-0477