A PDF Contributor’s form is available if you prefer hard copy:  AES/XPS paper version or SIMS Contributor's Form.

View the "Angles" diagram needed to complete Item C-19 in the AES/XPS Contributor's Form.

Converting VAMAS and ISO Angular Geometries to SSS
The American Vacuum Society Surface Science Spectra Database (SSS), the National Physical Laboratory Surface Chemical Analysis Standard Data Transfer Format (VAMAS) and the ISO 14976 Data Transfer Format (ISO) all employ comparable descriptions of instrument geometry and sample orientation. The systems all require specification of angular relationships that may not be commonly available in the instrument manufacturer's literature. In order to facilitate translation to the SSS data format, and promote its use, a practical guide is presented for calculating the necessary values.

Examples of SSS Articles
To give potential contributors some examples of published submissions, here are PDF versions of three articles from the Surface Science Spectra journal.
1."Core Level XPS Spectra of Silicon Carbide Using Zirconium and Magnesium Radiations," A.R. Chourasia, Surf. Sci. Spectra 8, 45 (2001).

2."Analysis of Cerium-Zirconium Mixed Metal Oxides by Auger Electron Spectroscopy," A.E. Nelson and K. Schultz, Surf. Sci. Spectra 7, 281 (2000).

3."Epitaxial TiN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching," N. Finnegan et al., Surf. Sci. Spectra 7, 213 (2000).

For more information on SSS, request subscription or submission information, or contact:

SSS Editorial Office
100 Park Drive, Suite 105,
Research Triangle Park, 27709
Phone (919) 226-0091 or 361-2787, Fax (919) 361-1378
E-mail sss@jvst.org