Electronic Contributor's Form
AVS has created an Electronic Contributor's Form (ECF) for submitting XPS and AES spectra and related data to the Surface Science Spectra database and journal. This DOS-based program automates much of the data entry associated with Surface Science Spectra submissions, and may be installed and run under Win95, Win98, Windows ME, and WinNT 4.0.

To download the latest ECF, click here.

If you or your institution have already published in SSS, your prior submission(s) may be added to your copy of ECF, to help in completing new submissions. For more information, write Dick Rubin at the AVS Data Center.

View the "Angles" diagram needed to complete Item C-19 in the AES/XPS Contributor's Form

PDF Contributor's Form
For those who would rather use the hard copy paper version of the SSS Contributor Forms and who have Adobe Acrobat Reader, you can download the pdf of the AES/XPS paper version.

If you are interested in submitting SIMS data, you may download the PDF for the latest pre-release paper version of the SIMS Contributor's Form.

Converting VAMAS and ISO Angular Geometries to SSS
The American Vacuum Society Surface Science Spectra Database (SSS), the National Physical Laboratory Surface Chemical Analysis Standard Data Transfer Format (VAMAS) and the ISO 14976 Data Transfer Format (ISO) all employ comparable descriptions of instrument geometry and sample orientation. The systems all require specification of angular relationships that may not be commonly available in the instrument manufacturer's literature. In order to facilitate translation to the SSS data format, and promote its use, a practical guide is presented for calculating the necessary values.

Examples of SSS Articles
To give potential contributors some examples of published submissions, here are PDF versions of three articles from the Surface Science Spectra journal.
1."Core Level XPS Spectra of Silicon Carbide Using Zirconium and Magnesium Radiations," A.R. Chourasia, Surf. Sci. Spectra 8, 45 (2001).

2."Analysis of Cerium-Zirconium Mixed Metal Oxides by Auger Electron Spectroscopy," A.E. Nelson and K. Schultz, Surf. Sci. Spectra 7, 281 (2000).

3."Epitaxial TiN(001) Grown and Analyzed In situ by AES After (1) Deposition and (2) Ar+ Sputter Etching," N. Finnegan et al., Surf. Sci. Spectra 7, 213 (2000).

For more information on SSS, request subscription or submission information, or contact:

SSS Editorial Office
100 Park Drive, Suite 105,
Research Triangle Park, 27709
Phone (919) 361-2498 or 361-2787, Fax (919) 361-1378
E-mail sss@jvst.org