Roster | Ian Gilmore

Ian Gilmore

Trustee (2015-2017)
National Physical Laboratory
Hampton Road, Teddington
Middlesex, TW11 OLW
Tel: 44-20-894-36922
IAN S. GILMORE is a National Physical Laboratory Fellow in Surface and Nanoanalysis and a Visiting Professor in the School of Pharmacy at the University of Nottingham. His group has a focus on applied surface science using vacuum based techniques such as SIMS and XPS, new ambient mass spectrometries using electrospray, plasma and laser probes and scanning probe microscopies. This rapidly growing group includes research on fundamentals, technique innovation, metrology and standards as well as technological and manufacturing applications in organic electronics, nanoelectronics, graphene devices, thin films, surface functionalization, nanoparticles, personal care, medical devices and pharmaceuticals. Ian has recently launched a UK National Centre of Excellence in Mass Spectrometry Imaging. He has authored and co-authored over 95 papers on surface analysis and is a Fellow of the Institute of Physics (UK). He was awarded the Institute’s Paterson Medal (2004) for his innovation of G-SIMS. Ian first came to AVS in 2000 and has been a member ever since. He was named an AVS Fellow in 2009. Ian has served on the AVS Board of Directors and was previously chair for the Applied Surface Science Division (ASSD). As ASSD Chair, he developed the divisional strategy leading to a clear action plan for growth that has strengthened the Division. As a Director he worked to establish the vision, mission and top-level objectives for the society and continues to lead the development of a strategy to provide a clear direction and make the most of new opportunities. Ian has a strong international network and has significant experience with conference organization in North America, Europe and Asia-Pacific. He is chair of the International SIMS conference series with responsibility to oversee the selection of conference chairs and venues. The conference series is keeping its vitality in challenging times for attendees. He is chairing a Royal Society (UK National Academy of Science) Scientific Meeting on Mass Spectrometry Imaging  and has previously successfully co-chaired the SIMS XV international conference (Manchester, 2005) and chaired the IUVSTA workshop on sputtering and ion emission by cluster ion beams (Scotland, 2007). Ian is chair of VAMAS for surface chemical analysis, which conducts interlaboratory studies in electron spectroscopies, scanning probe microscopies and mass spectrometries to advance the techniques, support uptake into industry and standardization. He leads the international development of standards for organic and nano SIMS through the ISO TC 201. Ian has made a major contribution to international leadership in surface analysis, recently recognized by the Rivière Prize from the UK Surface Analysis Forum.