ASSD - AVS Program
Advancing the Science and Technology of Materials, Interfaces, and Processing
The Applied Surface Science Division (ASSD) provides a forum for research in the preparation, modification, characterization, and utilization of surfaces in practical applications. Areas of interest range from nanoscience, polymers, and semiconductor processing to forensic science and biotechnology. The Division has long been the premier gathering place for the global surface analysis community, with historical concentrations in techniques such as SIMS and XPS/Auger spectroscopies, including presentations representing a mixture of cutting-edge applications and the fundamentals supporting the measurement science.
For 2017, we are excited to present a varied slate of topics ranging from Quantitative Surface Analysis to Forensics to in situ analyses. We have found invited speakers who will set the tone for amazing technical talks in our sessions. We begin the week with an invited talk by Tom Wirtz, who will be discussing Correlative Microscopy of Nano-Analytics, which introduces our session on correlative analyses. On Monday Afternoon, Mary Kraft will begin our Complex, organic and bio-systems session by presenting a talk on High-resolution SIMS imaging of Subcellular Structures. Quantitative Surface Analysis is our topic for Tuesday morning as our invited speaker, Rasmus Havelund, shares strategies for quantitative organic depth profiling and 2D imaging. Tuesday afternoon is dedicated to analytical challenges in the industrial laboratory, with invited talks from Daniel Hook of Bausch and Lomb and Vin Smentkowski of General Electric Research Division. On Wednesday morning. Nina Ogrinc Potocnik will give an invited talk to begin our session exploring analytical methods that push the limits of our traditional instrumentation. We are honored to host an invited talk from Felix Kolmer, our 2017 ASSD Peter Sherwood Award winner, who will present the evolution of Bi cluster LMIS in SIMS. Imaging, buried interfaces and nanostructures are the topics for Wednesday afternoon, where Jean-Paul Barnes discusses correlating hyperspectral and morphological characterization and Karen Kruska presents Corrosion and Radiation Damage Process Investigations through 2D and 3d Imaging at the Nanoscale. Thursday morning brings our session on Spectroscopy of the Changing Surface, starting with an invited talk by Iradwikanari Waluyo who will investigate dynamic transformations of catalysts surfaces with Ambient Pressure XPS. On Thursday afternoon, Lev Gelb and Matt Linford will present invited talks focusing on advances in data analysis in our session entitled, Advances in Instrumentation and Data Analysis. Please stay around for our Friday morning session, featuring an invited talk from Xingcheng Xiao who will be discussing in situ diagnostics of the coupled mechanical and electrochemical degradation of high capacity materials in Li Ion batteries. Additionally, Tom Beebe will discuss Surface Analysis of Fine Art: From the Renaissance to the Scream. This session features forensics and failure analysis talks which will be worth staying to hear!
All are welcome to attend the Tuesday evening ASSD business meeting, which will feature brief capsule presentations by our student award finalists: Pinar Aydogan Gukturk, Kilkent University, Elisa Harrison, University of Washington, and Monu Mishra, Academy of Scientific and Innovative Research. The following three talks will also be presented:
“J.J. Thompson’s ghost: Modern SIMS developments enable interface engineering at the technology forefront.”
Fred Stevie - North Carolina State University
SIMS is one of the keystone surface analysis techniques in the labs of the world, providing unmatched speciation and sensitivity to the surface analyst. Developments in SIMS technologies continue to advance the role of the technique, extending its reach into previously inaccessible analytical research regimes, and providing more complete information from materials traditionally analyzed using SIMS. Recognizing the implications of these developments is essential to understanding the ever-expanding place of SIMS in the laboratory, and to fully deploying its analytical potential.
“On the origin of the surface analysis species: The shared DNA of ASSD and ASTM-E42 in the formation of the Symposium on Applied Surface Analysis and the Quantitative Surface Analysis Conference.”
John Grant – Surface Analysis Consulting
Cedric Powell - NIST
ASSD and E42 have an intertwining history and they provided the foundation for the development of both the Symposium on Applied Surface Analysis and the topical conference on Quantitative Surface Analysis (QSA). These meetings offer a forum for the needs of researchers and analysts to solidify their understanding of the surface analysis techniques, contribute in their development, and improve the quality of research results. Having coursed through the changing trail marked out by the needs of the community, the happy (or haunting) histories of these meetings will be revealed and discussed.
Wolfgang Werner- Vienna University of Technology
Cedric Powell - NIST
Simulation and modeling are becoming indispensable tools throughout surface analysis, just as they have across the broad range of scientific and engineering disciplines. Simulation of Electron Spectra for Surface Analysis (SESSA) is a graphical simulation tool that gives the analyst the ability to see how the resulting photoelectron spectrum changes when the model of the surface structure is modified. SESSA includes effects of elastic scattering, and its models extend to nanomaterials structures, revealing critical surface chemistry information. The details of its development will be presented, and SESSA will be demonstrated, followed by lively discussion.