Short Course Catalog | A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days)

Course: A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days)

Course Objectives

  • Become familiar with the principles of these four materials analysis techniques
  • Learn the relative capabilities (and limitations) of the techniques, and their principle applications

Course Description

This course is a combination of the two one-day courses, XPS/AugerFIB/SIMS,  which are offered separately (see course descriptions). The combination provides attendees with a comprehensive treatment of these techniques at a significantly discounted cost compared to taking the two courses separately.
The emphasis is on understanding the physical principles of the techniques, the basics of the instruments, the uses for elemental and chemical state analysis (both qualitative and quantitative) and the lateral and depth resolution capabilities of each technique. Many illustrative examples are given across a range of materials.


Who Should Attend?

Scientists, engineers, technicians, and others who desire a practical, current understanding of XPS, AES, FIB, and SIMS.

Instructors

C.R. Brundle C.R. Brundle and Associates
Fred Stevie North Carolina State University, Senior Researcher

Course Materials

Course Notes

Cost: $$1020 (2-days) (XPS/ESCA and AES plus FIB and SIMS)