Short Course Instructors

**Each listed Instructor and Course is an active link that opens to their respective descriptions.
Instructor Biography Course Description
Richard Ahrenkiel Fundamentals of Semiconductor Characterization: Electrical and Optical Techniques
Gary S. Ash Cryopump Technology
Michael Bagge-Hansen UHV Design and Practices
Bharat Bhushan Adhesion and Stiction: Mechanisms, Measurement Techniques, and Methods for Reduction
Nanotribology and Nanomechanics and Applications to MEMS/NEMS and BioMEMS/BioNEMS
Joel Bowers Vacuum Vessel Engineering
Gerardo Brucker Partial Pressure Analysis with Residual Gas Analyzers
C.R. Brundle A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days)
Major Analytical Techniques other than XPS, AES, FIB, SIMS
Surface Analysis, Interface, and Thin Film Analysis: The Major Methods
X-ray Photoelectron Spectroscopy (XPS or ESCA), and Auger Electron Spectroscopy (AES)
X-Ray Photoelectron Spectroscopy (XPS): The Basics and Advanced Approaches and Applications
David Castner Surface Characterization of Biomaterials
John Caughman Basics of Radio Frequency Technology
Bob Childs An Overview of Applied Vacuum Technology
Fundamentals of Vacuum Technology
Tom Christensen Introduction to Surface Analysis
John Crowell CVD for Microelectronics
Michael Current Ion Implantation: Fundamentals, Process Controls and Advanced Applications
Tom Dory Semiconductor Device Manufacturing Overview
John Frankenthaler Photolithography Process in IC Production
Steve George Atomic Layer Deposition
Tim Gessert UHV Design and Practices
Controlling Contamination in Vacuum Systems
An Overview of Applied Vacuum Technology
Fundamentals of Vacuum Technology
Vacuum System Design
Operation & Maintenance of Vacuum Pumping Systems
Transparent Conducting Oxides: Applications, Science, Fabrication, and Characterization
Vacuum Leak Detection
Abe Ghanbari An Introduction to Ion Sources: Principles and Techniques
Plasma and Ion Beam Diagnostics: Principles & Applications
John Givens Copper Interconnect Technology
Chemical Mechanical Planarization for Microelectronics Manufacturing
Joe Greene Thin Film Nucleation, Growth, and Microstructural Evolution
Evaporation for Thin Film Deposition
Reactive Sputtering and Deposition
Sputter Deposition
Robert Grubbs Atomic Layer Deposition: Basic Principles, Characterizations, and Applications
Luke Hinkle Mass Flow Controllers: Fundamentals, Techniques, and Applications
Process Specific Pumping Requirements and Design
Frank Jansen Plasma-Enhanced CVD: Fundamentals, Techniques, and Applications
Bob Langley Analysis of Mass Spectrometer (RGA) Spectra
Allan Matthews Hard Coatings by PVD Methods
Richard Matyi High Resolution X-ray Reflection and Diffraction Methods for Thin Film Characterization
Gary McGuire Surface Preparation for Thin Film Deposition
Stella Pang Microfabrication Technology for MicroElectroMechanical Systems
Neil Peacock An Overview of Applied Vacuum Technology
Vacuum Sealing and Joining Techniques
Fundamentals of Vacuum Technology
Total Pressure Gauging Techniques
Karen Reinhardt Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing
Mikko Ritala Atomic Layer Deposition: Fundamentals, Chemistry and Applications
Angus Rockett Atomic Force and Scanning Tunneling Microscopy
Photovoltaics: The Engineering, Technology and Application of Solar Cells (1 day)
Photovoltaics: The Engineering, Technology and Application of Solar Cells (2 days)
Evaporation for Thin Film Deposition
Sputter Deposition
Bridget Rogers Semiconductor Device Manufacturing Overview
Phillip Russell Atomic Force and Scanning Tunneling Microscopy
Scanning Electron Microscopy and X-ray Microanalysis
Sudipta Seal Introduction to Nanomanufacturing
Roger Shrouf Vacuum and Cryogen Safety
Randy Shul Plasma Etching and RIE: Fundamentals and Applications
Robert Small Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing
T.C. Smith Ion Implantation Processing
William Sproul Hard Coatings by PVD Methods
Practice of Reactive Sputter Deposition
Sputter Deposition
Thin Film Deposition by Sputter Processes
Larry Stelmack An Introduction to Ion Beam Coating Deposition Techniques
Fred Stevie A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days)
Focused Ion Beams (FIB) and Secondary Ion Mass Spectrometry (SIMS)
Major Analytical Techniques other than XPS, AES, FIB, SIMS
Secondary Ion Mass Spectrometry
Ron Synowicki Introduction to Spectroscopic Ellipsometry
Harland G. Tompkins Introduction to Spectroscopic Ellipsometry
Woody Weed An Overview of Applied Vacuum Technology
Fundamentals of Vacuum Technology
Vacuum System Design
Vacuum Pumps