Short Course Instructors
| Fred Stevie
Fred Stevie is a Senior Researcher at the Analytical Instrumentation Facility in North Carolina State University and is responsible for SIMS and XPS analyses. His experience with materials characterization using ion beams and mass spectrometry spans more than 25 years, principally with Bell Laboratories at Murray Hill, New Jersey, Allentown, Pennsylvania, and Orlando, Florida. He has authored or co-authored more than 150 publications, including a book on SIMS. His contributions to the SIMS field cover a range of topics including quantification, surface roughening effects, interfacial contaminants, and insulator analysis. FIB interests include sample preparation for TEM, particularly using the lift-out method, and FIB-SIMS. He has also a research professor of Materials Science at the University of Central Florida. He is active in technical organizations, particularly the American Vacuum Society and the SIMS Workshop Series. He received a M.S. degree in physics from Vanderbilt University in 1970.