I. “J.J. Thompson’s Ghost:
Modern SIMS Developments Enable Interface Engineering at the Technology Forefront”
Fred Stevie, North Carolina State University
SIMS is one of the keystone surface analysis techniques in the labs of the world, providing unmatched speciation and sensitivity to the surface analyst. Developments in SIMS technologies continue to advance the role of the technique, extending its reach into previously inaccessible analytical research regimes, and providing more complete information from materials traditionally analyzed using SIMS. Recognizing the implications of these developments is essential to understanding the ever-expanding place of SIMS in the laboratory, and to fully deploying its analytical potential.
II. “On the Origin of the Surface Analysis Species:
The Shared DNA of ASSD and ASTM-E42 in the Formation of the
Symposium on Applied Surface Analysis and the Quantitative Surface Analysis Conference”
John Grant, Surface Analysis Consulting
Cedric Powell, NIST
ASSD and E42 have an intertwining history and they provided the foundation for the development of both the Symposium on Applied Surface Analysis and the topical conference on Quantitative Surface Analysis (QSA). These meetings offer a forum for the needs of researchers and analysts to solidify their understanding of the surface analysis techniques, contribute in their development, and improve the quality of research results. Having coursed through the changing trail marked out by the needs of the community, the happy (or haunting) histories of these meetings will be revealed and discussed.
III. “SESSA Unmasked”
Wolfgang Werner, Vienna University of Technology
Cedric Powell, NIST
Simulation and modeling are becoming indispensable tools throughout surface analysis, just as they have across the broad range of scientific and engineering disciplines. Simulation of Electron Spectra for Surface Analysis (SESSA) is a graphical simulation tool that gives the analyst the ability to see how the resulting photoelectron spectrum changes when the model of the surface structure is modified. SESSA includes effects of elastic scattering, and its models extend to nanomaterials structures, revealing critical surface chemistry information.