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Corporate Members

Short Course Instructors

**Each listed Instructor and Course is an active link that opens to their respective descriptions.

Instructor Biography	Course Description
Richard Ahrenkiel	Fundamentals of Semiconductor Characterization: Electrical and Optical Techniques
Kateryna Artyushkova	Essentials of Accurate and Reliable Surface Analysis using X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)
Michael Bagge-Hansen	UHV Design and Practices
Bharat Bhushan	Adhesion and Stiction: Mechanisms, Measurement Techniques, and Methods for Reduction Nanotribology and Nanomechanics and Applications to MEMS/NEMS and BioMEMS/BioNEMS
Joel Bowers	Vacuum Vessel Engineering
Gerardo Brucker	Partial Pressure Analysis with Residual Gas Analyzers
C.R. Brundle	A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days) Major Analytical Techniques other than XPS, AES, FIB, SIMS Surface Analysis, Interface, and Thin Film Analysis: The Major Methods X-Ray Photoelectron Spectroscopy (XPS): The Basics and Advanced Approaches and Applications
David Castner	Surface Characterization of Biomaterials
John Caughman	Basics of Radio Frequency Technology
Bob Childs	An Overview of Applied Vacuum Technology Fundamentals of Vacuum Technology
Tom Christensen	Introduction to Surface Analysis
John Crowell	CVD for Microelectronics
Michael Current	Ion Implantation: Fundamentals, Process Controls and Advanced Applications
Tom Dory	Semiconductor Device Manufacturing Overview
John Frankenthaler	Photolithography Process in IC Production
Steve George	Atomic Layer Deposition Atomic Layer Etching
Tim Gessert	UHV Design and Practices Controlling Contamination in Vacuum Systems An Overview of Applied Vacuum Technology Fundamentals of Vacuum Technology Vacuum System Design Operation & Maintenance of Vacuum Pumping Systems Transparent Conducting Oxides: Applications, Science, Fabrication, and Characterization Vacuum Leak Detection Vacuum Pumps
Abe Ghanbari	An Introduction to Ion Sources: Principles and Techniques Plasma and Ion Beam Diagnostics: Principles & Applications
John Givens	Copper Interconnect Technology Chemical Mechanical Planarization for Microelectronics Manufacturing
Joe Greene	Thin Film Nucleation, Growth, and Microstructural Evolution Evaporation for Thin Film Deposition Reactive Sputtering and Deposition Sputter Deposition
Robert Grubbs	Atomic Layer Deposition: Basic Principles, Characterizations, and Applications
Edwin E. Harrow	Cryopump Technology
Frank Jansen	Plasma-Enhanced CVD: Fundamentals, Techniques, and Applications
Bob Langley	Analysis of Mass Spectrometer (RGA) Spectra
Allan Matthews	Hard Coatings by PVD Methods
Richard Matyi	High Resolution X-ray Reflection and Diffraction Methods for Thin Film Characterization
Gary McGuire	Surface Preparation for Thin Film Deposition
Stella Pang	Microfabrication Technology for MicroElectroMechanical Systems
Neil Peacock	An Overview of Applied Vacuum Technology Vacuum Sealing and Joining Techniques Fundamentals of Vacuum Technology Total Pressure Gauging Techniques Vacuum Leak Detection
Karen Reinhardt	Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing
Allen Riddle	Fundamentals of Vacuum Technology
Mikko Ritala	Atomic Layer Deposition: Fundamentals, Chemistry and Applications
Angus Rockett	Atomic Force and Scanning Tunneling Microscopy Photovoltaics: The Engineering, Technology and Application of Solar Cells (1 day) Photovoltaics: The Engineering, Technology and Application of Solar Cells (2 days) Evaporation for Thin Film Deposition Sputter Deposition
Bridget Rogers	Semiconductor Device Manufacturing Overview
Phillip Russell	Atomic Force and Scanning Tunneling Microscopy Scanning Electron Microscopy and X-ray Microanalysis
Sudipta Seal	Introduction to Nanomanufacturing
Roger Shrouf	Vacuum and Cryogen Safety
Randy Shul	Plasma Etching and RIE: Fundamentals and Applications
Robert Small	Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing
T.C. Smith	Ion Implantation Processing
William Sproul	Hard Coatings by PVD Methods Practice of Reactive Sputter Deposition Sputter Deposition Thin Film Deposition by Sputter Processes
Larry Stelmack	An Introduction to Ion Beam Coating Deposition Techniques
Fred Stevie	A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days) Focused Ion Beams (FIB) and Secondary Ion Mass Spectrometry (SIMS) Major Analytical Techniques other than XPS, AES, FIB, SIMS Secondary Ion Mass Spectrometry
Ron Synowicki	Introduction to Spectroscopic Ellipsometry
Harland G. Tompkins	Introduction to Spectroscopic Ellipsometry
Viacheslav V. Zhuring	Industrial Ion Sources