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- AVS 71st International Symposium & Exhibition
- AVS Professional Development Webinar: Useless Meetings End Here: Lead and Participate Like a Pro
- AVS 25th International Conference on Atomic Layer Deposition
- ICMCTF'25- International Conference On Metallurgical Coatings & Thin Films
- 15th International Workshop on Oxide Surfaces (IWOX XV)
- 51st International Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-51 2026)
- ICMCTF'26- International Conference On Metallurgical Coatings & Thin Films
- AVS Board of Directors’ Meeting
- 69th Annual SVC TechCon and Exhibition
- AVS Hudson Mohawk Chapter - 2026 Spring Meeting
- AVS e-Talk: Enabling Scalable Superconducting Quantum Devices with 300 mm Wafer Processes
- AVS Mid-Atlantic Chapter JLab Meeting/Student Poster Competition
- ALD/ALE 2026: AVS 26th International Conference on Atomic Layer Deposition (ALD 2026) featuring the 13th International Atomic Layer Etching Workshop (ALE 2026)
- AVS Michigan Chapter 2026 Spring Symposium
- AVS National Short Course Program: Basics of Radio Frequency Technology
- AVS Publications Webinar: Writing an Effective Abstract
- AVS 72nd International Symposium & Exhibition
- AVS Board of Directors’ Meeting
- 35th International Standards Organization Technical Committee 201 Plenary Meeting
- AVS National Short Course Program
- Surface meets Function: Achieving diamond-like properties at low temperatures Scalable coatings for Wear, Biomedical, Electrochemical, Optical and Barrier Applications
- NCCAVS 46th Annual Equipment Exhibition | NCCAVS Technical Symposium & Workshop/Tutorial |13th Annual Student Poster Session
- AVS Board of Directors’ Meeting
- Area Selective Deposition Workshop (ASD 2026)
- Frontiers in Characterization and Metrology for Nanoelectronics (FCMN 2026)
- Pittcon Conference and Exposition 2026
- AVS National Short Course Program
- AVS New Mexico Chapter Symposium, Short Courses, and Exhibition
- AVS Pacific Northwest Chapter Hosts the Inaugural Critical Minerals & Materials Science Summit (CM2S2) | May 12–14, 2026
- AVS e-Talk: Electron-Enhanced Atomic Scale Processing for the Low Temperature Deposition and Etching of Thin Films
- AVS Publications Development Webinar: Writing an Effective Abstract
- AVS National Short Course: Fundamentals of Vacuum Technology
- International Conference on Electron, Ion, Photon Beam Technology and Nanofabrication (EIPBN 2026)
- 24th International Conference on Molecular Beam Epitaxy (ICMBE 2026)
- 39th International Vacuum Nanoelectronics Conference (IVNC 2026)
- AVS Board of Directors’ Meeting (via Zoom)
- AVS Ohio 2026 Symposium and Poster Session
- International Workshop on Gallium Oxide and Related Materials (IWGO 2026)
- Physical Electronics Conference (PEC 2026)
- AVS Professional Development Webinar: Mentoring Up: Ways to Get What You Need From Your Mentors
- Liquid Metal Processing and Casting Conference
- AVS Rocky Mountain Chapter Symposium
- AVS Rocky Mountain Chapter Short Course Program
- AVS Pacific Northwest Chapter 37th Annual Symposium
- AVS Professional Development Webinar: Using Expectations Documents as a Tool to Improve Your Mentoring Relationships
- AVS Hudson Mohawk Chapter - 2026 Fall Meeting
- Workshop on Innovative Nanoscale Devices and Systems (WINDS 2026)
- Atomic Layer Deposition Materials-to-Manufacturing
- ICMCTF'27- International Conference On Metallurgical Coatings & Thin Films
- Area Selective Deposition Workshop (ASD 2027)
- AVS Board of Directors’ Meeting
- 52nd International Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-52 2027)
- AVS Board of Directors’ Meeting (via Zoom)
- 1st American Workshop on Ellipsometry (AWE-1)
- The 10th TACT International Thin Film Conference (TACT 2027)
- ALD/ALE 2027: AVS 27th International Conference on Atomic Layer Deposition (ALD 2027) featuring the 14th International Atomic Layer Etching Workshop (ALE 2027)
- North American Molecular Beam Epitaxy Conference (NAMBE 2027)
- AVS Board of Directors’ Meeting (via Zoom)
- AVS 73rd International Symposium & Exhibition
- AVS Board of Directors’ Meeting
- Frontiers in Characterization and Metrology for Nanoelectronics (FCMN 2028)
- International Conference on Secondary Ion Mass Spectrometry (SIMS 2028)
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- TBD
- Neil Peacock
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- Mikko Ritala
- John Frankenthaler
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- Viacheslav V. Zhurin
- Michael Bagge-Hansen
- An Introduction to Ion Beam Coating Deposition Techniques
- Atomic Layer Deposition
- Atomic Layer Deposition: Basic Principles, Characterizations, and Applications
- Atomic Layer Deposition: Fundamentals, Chemistry and Applications
- CVD for Microelectronics
- Evaporation for Thin Film Deposition
- Plasma-enhanced Atomic Layer Deposition: Basics, Equipment, Applications
- Plasma-enhanced CVD: Fundamentals, Techniques, and Applications
- Practice of Reactive Sputter Deposition
- Reactive Sputtering and Deposition
- Sputter Deposition
- Thin Film Deposition by Sputter Processes
- High Power Impulse Magnetron Sputtering (HiPIMS)
- Adhesion and Stiction: Mechanisms, Measurement Techniques, and Methods for Reduction
- An Introduction to Ion Sources: Principles and Techniques
- Basics of Radio Frequency Technology (1-day)
- Basics of Radio Frequency Technology (2-days)
- Chemical Mechanical Planarization for Microelectronics Manufacturing
- Cleaning and Surface Conditioning Techniques for Integrated Circuit Manufacturing
- Industrial Ion Processing
- Ion Implantation Processing
- Ion Implantation: Fundamentals, Process Controls and Advanced Applications
- Photolithography Process in IC Production
- Plasma and Ion Beam Diagnostics: Principles & Applications
- Surface Preparation for Thin Film Deposition
- Hard Coatings by PVD Methods
- Photovoltaics: The Engineering, Technology and Application of Solar Cells (1 day)
- Photovoltaics: The Engineering, Technology and Application of Solar Cells (2 days)
- Thin Film Nucleation, Growth, and Microstructural Evolution
- Transparent Conducting Oxides: Applications, Science, Fabrication, and Characterization
- Atomic Layer Etching
- Plasma Etching and RIE: Fundamentals and Applications
- Fundamentals of Plasmas
- Copper Interconnect Technology
- Introduction to Nanomanufacturing
- Microfabrication Technology for MicroElectroMechanical Systems
- Nanotribology and Nanomechanics and Applications to MEMS/NEMS and BioMEMS/BioNEMS
- Semiconductor Device Manufacturing Overview
- Surface Characterization of Biomaterials
- A Comprehensive Course on Surface Analysis and Depth Profiling by X-Ray Photoelectron Spectroscopy (XPS or ESCA), Auger Electron Spectroscopy (AES), Focused Ion Beam Analysis (FIB) and Secondary Ion Mass Spectrometry (SIMS) (2 days)
- Essentials of Accurate and Reliable Surface Analysis using X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)
- Focused Ion Beams (FIB) and Secondary Ion Mass Spectrometry (SIMS)
- High Resolution X-ray Reflection and Diffraction Methods for Thin Film Characterization
- Introduction to FIB Instrumentation, Applications, and Methods
- Introduction to Spectroscopic Ellipsometry
- Major Analytical Techniques other than XPS, AES, FIB, SIMS
- Scanning Electron Microscopy and X-ray Microanalysis
- Time of Flight Secondary Ion Mass Spectrometry
- X-Ray Photoelectron Spectroscopy (XPS): The Basics and Advanced Approaches and Applications
- Introduction to Surface Analysis
- Surface Analysis, Interface, and Thin Film Analysis: The Major Methods
- Fundamentals of Semiconductor Characterization: Electrical and Optical Techniques
- Atomic Force and Scanning Tunneling Microscopy
- Vacuum and Cryogen Safety
- UHV Design and Practices
- Vacuum Sealing and Joining Techniques
- Vacuum System Design
- Vacuum System Layout, Design Whys, Use, and Troubleshooting
- Vacuum Vessel Engineering
- An Overview of Applied Vacuum Technology
- Fundamentals of Vacuum Technology*
- Controlling Contamination in Vacuum Systems
- Cryopump Technology
- Operation & Maintenance of Vacuum Pumping Systems
- Vacuum System Leak Detection and Basic Troubleshooting
- Vacuum Pumps: An Introduction to their Operation and Maintenance
- Analysis of Mass Spectrometer (RGA) Spectra
- Partial Pressure Analysis with Residual Gas Analyzers
- Total Pressure Gauging Techniques
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- Ellen Fisher
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- Thin Film Division Paul H. Holloway Young Investigator Award
- Thin Film Division Russell F. Messier Mid-Career Award and Lecture
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- Nanoscale Science and Technology Division Graduate Competition
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